Exploring deep learning models for 4D-STEM-DPC data processing

2024-10-1

Application of a Novel Local and Automatic PCA Algorithm for Diffraction Pattern Denoising in TEM-ASTAR Analysis in Microelectronics

2024-10-1

A simple and intuitive model for long-range 3D potential distributions of in-operando TEM-Samples: Comparison with electron holographic tomography

2024-9-28

EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries

2024-9-21

Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy

2024-9-19

On the temporal transfer function in STEM imaging from finite detector response time

2024-9-19

Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopy

2024-9-19

Ultra-low-noise transimpedance amplifier with a single HEMT in pre-amplifier for measuring shot noise in cryogenic STM

2024-9-19

Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces

2024-9-18

A New Method for Estimating Nanoparticle Deposition Coverage from a Set of Weak-Contrast SEM Images

2024-9-14

Theoretical Study on the Effect of Temperature Gradient on Contact-Free Scanning for scanning ion conductance microscopy

2024-9-14

Atomic resolution scanning transmission electron microscopy at liquid helium temperatures for quantum materials

2024-9-7

Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by Scanning Precession Electron Diffraction Tomography

2024-9-6

Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials

2024-9-3

Maximizing the notional area in single tip field emitters

2024-9-1

Development of a Liquid-Helium Free Cryogenic Sample Holder with mK Temperature Control for Autonomous Electron Microscopy

2024-9-1

The Impact of Electric Field Strength on the Accuracy of Boron Dopant Quantification in Silicon using Atom Probe Tomography

2024-8-22

DIFFERENTIAL PHASE CONTRAST STEM IMAGE CALCULATION SOFTWARE – Magnifier

2024-8-22

Design of Electrostatic Lenses through Genetic Algorithm and Particle Swarm Optimisation Methods Integrated with Differential Algebra

2024-8-15

Autoencoder latent space sensitivity to material structure in convergent-beam low energy electron diffraction

2024-8-6

The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffraction

2024-8-5

Optimization of three-dimensional electron diffuse scattering data acquisition

2024-8-3

Differential phase contrast from electrons that cause inner shell ionization

2024-8-1

Probing the interaction range of electron beam-induced etching in STEM by a non-contact electron beam

2024-7-25

Investigation of thermal effects of laser micromachining for APT and TEM specimen preparation: A modeling and experimental study

2024-7-22

Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projection

2024-7-20

Calibrating Cryogenic Temperature of TEM Specimens using EELS

2024-7-8

Elastic strain mapping of plastically deformed materials by TEM

2024-7-7

Robust methodology for the EBSD local misorientation analysis of surface cold work

2024-6-27

Angular momentum transfer from swift electrons to non-spherical nanoparticles within the dipolar approximation

2024-6-12

Origin of giant enhancement of phase contrast in electron holography of modulation-doped <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si43.svg" display="inline" id="d1e166"><mml:mi>n</mml:mi></mml:math>-type GaN

2024-6-9

New Poisson denoising method for pulse-count STEM imaging

2024-5-27

Interpretability of High-Resolution Transmission Electron Microscopy Images

2024-5-27

Reaction-diffusion study of electron-beam-induced contamination growth

2024-5-27

Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy

2024-5-15

Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy

2024-5-9

A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicity

2024-5-8

Atomic force microscopy in mechanical measurements of single nanowires

2024-5-7

Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy

2024-4-22

Ghostbuster: A phase retrieval diffraction tomography algorithm for cryo-EM

2024-4-12

Secondary-electron imaging of bulk crystalline specimens in an aberration corrected STEM

2024-4-10

Strain visualization using large-angle convergent-beam electron diffraction

2024-4-10

A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning

2024-4-10

High-resolution scanning tunneling microscope and its adaptation for local thermopower measurements in 2D materials

2024-4-9